Bruker D6 PHASER X-Ray Diffraction & Scattering

What it does

The D6 PHASER measures how X-rays are diffracted by the atomic planes in a material. The resulting diffraction pattern can be used to determine:

• Phase identification — what crystalline compounds/phases are present
• Crystal structure — information about lattice parameters and structure
• Crystallinity — crystalline vs. amorphous content
• Phase composition — including quantitative phase analysis with suitable methods
• Crystallite size and microstrain — commonly using peak-broadening analysis
• Preferred orientation (texture)
• Thin films and coatings — depending on configuration
• Small-angle X-ray scattering (SAXS) applications when appropriately configured

Basic principle

The instrument directs an X-ray beam onto the sample:

X-ray source → sample → diffracted X-rays → detector → diffraction pattern

Diffraction occurs when the geometry satisfies Bragg’s law:

nλ=2dsin⁡θn\lambda = 2d\sin\theta

where:

• nn = diffraction order
• λ\lambda = X-ray wavelength
• dd = spacing between crystal planes
• θ\theta = Bragg angle

The measured intensity versus 2θ2\theta produces a characteristic XRD pattern, essentially a fingerprint of the crystalline material.

Typical applications

The D6 PHASER can be useful for materials such as:

If you tell me whether you want (1) a detailed explanation of the D6 PHASER components, (2) how to operate it and run an XRD measurement, (3) how to analyze its XRD data, or (4) specifications and capabilities, I can explain that in detail.